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Steps on current-voltage characteristics of a silicon quantum dot covered by natural oxide
S. V. Vyshenski, U. Zeitler, R. J. Haug
Published 2002-10-04, updated 2002-10-28Version 2
Considering a double-barrier structure formed by a silicon quantum dot covered by natural oxide with two metallic terminals, we derive simple conditions for a step-like voltage-current curve. Due to standard chemical properties, doping phosphorus atoms located in a certain domain of the dot form geometrically parallel current channels. The height of the current step typically equals to (1.2 pA)N, where N=0,1,2,3... is the number of doping atoms inside the domain, and only negligibly depends on the actual position of the dopants. The found conditions are feasible in experimentally available structures.
Comments: 4 pages, 3 figures
Journal: Pis'ma v ZhETF, vol 76, iss 9, pp.665-668 (2002); aka JETP Letters
DOI: 10.1134/1.1538291
Categories: cond-mat.mes-hall
Keywords: silicon quantum dot, natural oxide, current-voltage characteristics, form geometrically parallel current channels
Tags: journal article
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