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Shot noise in self-assembled InAs quantum dots
A. Nauen, I. Hapke-Wurst, F. Hohls, U. Zeitler, R. J. Haug, K. Pierz
Published 2002-07-10Version 1
We investigate the noise properties of a GaAs-AlAs-GaAs tunneling structure with embedded self-assembled InAs quantum dots in the single-electron tunneling regime. We analyze the dependence of the relative noise amplitude of the shot noise on bias voltage. We observe a non-monotonic behaviour of the Fano-factor $\alpha$ with an average value of $\alpha \approx 0.8$ consistent with the asymmetry of the tunneling barriers. Reproducible fluctuations observed in $\alpha$ can be attributed to the successive participation of more and more InAs quantum dots in the tunneling current.
Categories: cond-mat.mes-hall
Keywords: shot noise, embedded self-assembled inas quantum dots, average value, single-electron tunneling regime, gaas-alas-gaas tunneling structure
Tags: journal article
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