The Quantum Twisting Microscope

Alon Inbar, John Birkbeck, Jiewen Xiao, Takashi Taniguchi, Kenji Watanabe, Binghai Yan, Yuval Oreg, Ady Stern, Erez Berg, Shahal Ilani

Published 2022-08-10Version 1

The invention of scanning probe microscopy has revolutionized the way electronic phenomena are visualized. While present-day probes can access a variety of electronic properties at a single location in space, a scanning microscope that can directly probe the quantum mechanical existence of an electron at multiple locations would provide direct access to key quantum properties of electronic systems, so far unreachable. Here, we demonstrate a conceptually new type of scanning probe microscope - the Quantum Twisting Microscope (QTM) - capable of performing local interference experiments at its tip. The QTM is based on a unique van-der-Waals tip, allowing the creation of pristine 2D junctions, which provide a multitude of coherently-interfering paths for an electron to tunnel into a sample. With the addition of a continuously scanned twist angle between the tip and sample, this microscope probes electrons in momentum space similar to the way a scanning tunneling microscope probes electrons in real space. Through a series of experiments, we demonstrate room temperature quantum coherence at the tip, study the twist angle evolution of twisted bilayer graphene, directly image the energy bands of monolayer and twisted bilayer graphene, and finally, apply large local pressures while visualizing the evolution of the flat energy bands of the latter. The QTM opens the way for novel classes of experiments on quantum materials.