arXiv:1612.07159 [cond-mat.stat-mech]AbstractReferencesReviewsResources
Effect of film thickness on the width of percolation threshold in metal-dielectric composites
M. Mokhtari, L. Zekri, A. Kaiss, N. Zekri
Published 2016-12-21Version 1
The effect of thickness on the width of the percolation threshold in metal-dielectric composite films was examined. The distribution of current intensities through cubic networks of metal and dielectric components was determined using Kirchhoff's equations. From the tail of current distribution, the width of the percolation threshold was defined using L\'evy statistics, and determined as a function of the film thickness for a system size 100. In the 2D-3D crossover region, the percolation width decreases as a power-law with a power exponent of $ 0.36\pm 0.01$.
Comments: 7 pages, 4 figures
Journal: Condensed Matter Physics, 2016, vol. 19, No. 4, 43001
DOI: 10.5488/CMP.19.43001
Categories: cond-mat.stat-mech
Keywords: percolation threshold, film thickness, metal-dielectric composite films, 2d-3d crossover region, percolation width decreases
Tags: journal article
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