Scaling of the Thue-Morse diffraction measure

Michael Baake, Uwe Grimm, Johan Nilsson

Published 2013-11-18Version 1

We revisit the well-known and much studied Riesz product representation of the Thue-Morse diffraction measure, which is also the maximal spectral measure for the corresponding dynamical spectrum in the complement of the pure point part. The known scaling relations are summarised, and some new findings are explained.