X-ray cross-correlation analysis of disordered systems: potentials and limitations

R. P. Kurta, M. Altarelli, I. A. Vartanyants

Published 2013-02-23Version 1

Angular x-ray cross-correlation analysis (XCCA) is an approach to study the structure of disordered systems using the results of x-ray scattering experiments. In this paper we summarize recent theoretical developments related to the Fourier analysis of the cross-correlation functions. Results of our simulations demonstrate the application of XCCA to two- and three-dimensional (2D and 3D) disordered systems of particles. We show that the structure of a single particle can be recovered using x-ray data collected from a 2D disordered system of identical particles. We also demonstrate that valuable structural information about the local structure of 3D systems, inaccessible from a standard small-angle x-ray scattering experiment, can be resolved using XCCA.