arXiv Analytics

Sign in

arXiv:1109.5962 [cond-mat.mes-hall]AbstractReferencesReviewsResources

Observation of a Snap-Through Instability in Graphene

Scott Scharfenberg, Nikhita Mansukhani, Cesar Chialvo, Richard L. Weaver, Nadya Mason

Published 2011-09-27Version 1

We examine the competition between adhesive and bending energies for few-layered graphene samples placed on rigid, microscale-corrugated substrates. Using atomic force microscopy, we show that the graphene undergoes a sharp "snap-through" transition as a function of layer thickness, where the material transitions between conforming to the substrate and lying flat on top of the substrate. By utilizing the critical snap-through thickness in an elasticity model for the FLG's bending, we extract a value for graphene-surface adhesion energy that is larger than expected for van der Waals forces.

Related articles: Most relevant | Search more
arXiv:0910.0005 [cond-mat.mes-hall] (Published 2009-09-30)
Energy levels of few electron quantum dots imaged and characterized by atomic force microscopy
arXiv:2406.17157 [cond-mat.mes-hall] (Published 2024-06-24)
Validation of contact mechanics models for Atomic Force Microscopy via Finite Elements Analysis
arXiv:1804.04382 [cond-mat.mes-hall] (Published 2018-04-12)
The influence of electrostatic interaction on lateral manipulation of single iron atoms using tilted CO and metal tips in atomic force microscopy