Defect states and disorder in charge transport in semiconductor nanowires

Dongkyun Ko, X. W. Zhao, Kongara M. Reddy, O. D. Restrepo, R. Mishra, I. S. Beloborodov, Nandini Trivedi, Nitin P. Padture, W. Windl, F. Y. Yang, E. Johnston-Halperin

Published 2011-06-22Version 1

We present a comprehensive investigation into disorder-mediated charge transport in InP nanowires in the statistical doping regime. At zero gate voltage transport is well described by the space charge limited current model and Efros-Shklovskii variable range hopping, but positive gate voltage (electron accumulation) reveals a previously unexplored regime of nanowire charge transport that is not well described by existing theory. The ability to continuously tune between these regimes provides guidance for the extension of existing models and directly informs the design of next-generation nanoscale electronic devices.