{
  "id": "cond-mat/9803335",
  "version": "v1",
  "published": "1998-03-27T05:31:29.000Z",
  "updated": "1998-03-27T05:31:29.000Z",
  "title": "Shot noise in diffusive conductors: A quantitative analysis of electron-phonon interaction effects",
  "authors": [
    "Y. Naveh",
    "D. V. Averin",
    "K. K. Likharev"
  ],
  "comment": "4 pages, 3 figures",
  "journal": "Phys. Rev. B 58, 15371 (1998)",
  "doi": "10.1103/PhysRevB.58.15371",
  "categories": [
    "cond-mat.mes-hall",
    "cond-mat.str-el"
  ],
  "abstract": "Using the 'drift-diffusion-Langevin' equation, we have quantitatively analyzed the effects of electron energy relaxation via their interaction with phonons, generally in presence of electron-electron interaction, on shot noise in diffusive conductors. We have found that the noise power $ S_I(\\omega )$ (both at low and high observation frequencies $\\omega $) drops to half of its 'mesoscopic' value only at $\\beta \\gtrsim 100,$ where $\\beta $ is the ratio of the sample length $L$ to the energy relaxation length $l_{% {\\rm ph}}$ (the latter may be much larger then the dephasing length). It means in particular that at low temperatures the shot noise may be substantial even when $L\\sim 10^{-2}$ -- $10^{-1}$ cm, and the conductor is 'macroscopic' in any other respect.",
  "revisions": [
    {
      "version": "v1",
      "updated": "1998-03-27T05:31:29.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "shot noise",
      "electron-phonon interaction effects",
      "diffusive conductors",
      "quantitative analysis",
      "electron energy relaxation"
    ],
    "tags": [
      "journal article"
    ],
    "publication": {
      "publisher": "APS",
      "journal": "Phys. Rev. B"
    },
    "note": {
      "typesetting": "TeX",
      "pages": 4,
      "language": "en",
      "license": "arXiv",
      "status": "editable"
    }
  }
}