{
  "id": "cond-mat/0604289",
  "version": "v1",
  "published": "2006-04-11T20:45:11.000Z",
  "updated": "2006-04-11T20:45:11.000Z",
  "title": "Single-Walled Carbon Nanotubes as Shadow Masks for Nanogap Fabrication",
  "authors": [
    "E. P. De Poortere",
    "L. M. Huang",
    "M. Huang",
    "S. J. Wind",
    "S. O'Brien",
    "J. Hone",
    "H. L. Stormer"
  ],
  "journal": "Appl. Phys. Lett. 88, 143124 (2006)",
  "doi": "10.1063/1.2192636",
  "categories": [
    "cond-mat.mes-hall",
    "cond-mat.mtrl-sci"
  ],
  "abstract": "We describe a technique for fabricating nanometer-scale gaps in Pt wires on insulating substrates, using individual single-walled carbon nanotubes as shadow masks during metal deposition. More than 80% of the devices display current-voltage dependencies characteristic of direct electron tunneling. Fits to the current-voltage data yield gap widths in the 0.8-2.3 nm range for these devices, dimensions that are well suited for single-molecule transport measurements.",
  "revisions": [
    {
      "version": "v1",
      "updated": "2006-04-11T20:45:11.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "single-walled carbon nanotubes",
      "shadow masks",
      "nanogap fabrication",
      "current-voltage data yield gap widths",
      "devices display current-voltage dependencies characteristic"
    ],
    "tags": [
      "journal article"
    ],
    "note": {
      "typesetting": "TeX",
      "pages": 0,
      "language": "en",
      "license": "arXiv",
      "status": "editable"
    }
  }
}