{ "id": "cond-mat/0510058", "version": "v1", "published": "2005-10-03T21:45:53.000Z", "updated": "2005-10-03T21:45:53.000Z", "title": "Roughness fluctuations, roughness exponents and the universality class of ballistic deposition", "authors": [ "Fabio D. A. Aarao Reis" ], "comment": "12 pages (4 figures included); to be published in Physica A", "doi": "10.1016/j.physa.2005.09.052", "categories": [ "cond-mat.stat-mech", "cond-mat.mtrl-sci" ], "abstract": "In order to estimate roughness exponents of interface growth models, we propose the calculation of effective exponents from the roughness fluctuation (sigma) in the steady state. We compare the finite-size behavior of these exponents and the ones calculated from the average roughness for two models in the 2+1-dimensional Kardar-Parisi-Zhang (KPZ) class and for a model in the 1+1-dimensional Villain-Lai-Das Sarma (VLDS) class. The values obtained from sigma provide consistent asymptotic estimates, eventually with smaller finite-size corrections. For the VLDS (nonlinear molecular beam epitaxy) class, we obtain alpha=0.93+-0.01, improving previous estimates. We also apply this method to two versions of the ballistic deposition model in two-dimensional substrates, in order to clarify the controversy on its universality class raised by numerical results and a recent derivation of its continuous equation. Effective exponents calculated from sigma suggest that both versions are in the KPZ class. Additional support to this conclusion is obtained by a comparison of the full roughness distributions of those models and the distribution of other discrete KPZ models.", "revisions": [ { "version": "v1", "updated": "2005-10-03T21:45:53.000Z" } ], "analyses": { "keywords": [ "universality class", "roughness fluctuation", "nonlinear molecular beam epitaxy", "estimate roughness exponents", "full roughness distributions" ], "tags": [ "journal article" ], "note": { "typesetting": "TeX", "pages": 12, "language": "en", "license": "arXiv", "status": "editable" } } }