{
  "id": "cond-mat/0305108",
  "version": "v3",
  "published": "2003-05-06T14:27:46.000Z",
  "updated": "2003-11-21T17:21:49.000Z",
  "title": "Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope",
  "authors": [
    "Y. Yaish",
    "J. -Y. Park",
    "S. Rosenblatt",
    "V. Sazonova",
    "M. Brink",
    "P. L. McEuen"
  ],
  "comment": "4 pages, 5 figures",
  "doi": "10.1103/PhysRevLett.92.046401",
  "categories": [
    "cond-mat.mes-hall",
    "cond-mat.mtrl-sci"
  ],
  "abstract": "We use an Atomic Force Microscope (AFM) tip to locally probe the electronic properties of semiconducting carbon nanotube transistors. A gold-coated AFM tip serves as a voltage or current probe in three-probe measurement setup. Using the tip as a movable current probe, we investigate the scaling of the device properties with channel length. Using the tip as a voltage probe, we study the properties of the contacts. We find that Au makes an excellent contact in the p-region, with no Schottky barrier. In the n-region large contact resistances were found which dominate the transport properties.",
  "revisions": [
    {
      "version": "v3",
      "updated": "2003-11-21T17:21:49.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "atomic force microscope",
      "electrical nanoprobing",
      "properties",
      "n-region large contact resistances",
      "current probe"
    ],
    "tags": [
      "journal article"
    ],
    "publication": {
      "publisher": "APS",
      "journal": "Phys. Rev. Lett."
    },
    "note": {
      "typesetting": "TeX",
      "pages": 4,
      "language": "en",
      "license": "arXiv",
      "status": "editable"
    }
  }
}