{
  "id": "2502.05527",
  "version": "v1",
  "published": "2025-02-08T11:17:44.000Z",
  "updated": "2025-02-08T11:17:44.000Z",
  "title": "Preserving Twist-Angle in Marginally Twisted Double-Bilayer Graphene Devices During Fabrication",
  "authors": [
    "Hyeon-Woo Jeong",
    "Jiho Kim",
    "Boknam Chae",
    "Kenji Watanabe",
    "Takashi Taniguchi",
    "Gil-Ho Lee"
  ],
  "comment": "15 pages, 4 figures",
  "categories": [
    "cond-mat.mes-hall",
    "cond-mat.mtrl-sci"
  ],
  "abstract": "Twisted van der Waals heterostructures provide a platform for studying a wide range of electron correlation phenomena, including unconventional superconductivity and correlated insulating states. However, fabricating such devices is challenging due to the difficulty in achieving and maintaining homogeneous twist-angles. Here, we present a fabrication method to preserve the twist-angle with minimal deformation. We fabricated marginally twisted double-bilayer graphene (mTDBG) stacks and directly imaged the resulting triangular superlattice periodicity via scattering-type scanning near-field optical microscopy (s-SNOM). This technique enabled us to monitor twist-angle deformation at each fabrication step, paving the way for more reliable device fabrication and facilitating the exploration of twist-angle-dependent physics.",
  "revisions": [
    {
      "version": "v1",
      "updated": "2025-02-08T11:17:44.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "marginally twisted double-bilayer graphene devices",
      "fabrication",
      "preserving twist-angle",
      "scanning near-field optical microscopy",
      "twisted van der waals heterostructures"
    ],
    "note": {
      "typesetting": "TeX",
      "pages": 15,
      "language": "en",
      "license": "arXiv",
      "status": "editable"
    }
  }
}