{
  "id": "2211.00670",
  "version": "v1",
  "published": "2022-11-01T18:01:40.000Z",
  "updated": "2022-11-01T18:01:40.000Z",
  "title": "Stochastic thermodynamic bounds on logical circuit operation",
  "authors": [
    "Phillip Helms",
    "David T. Limmer"
  ],
  "comment": "6 pages, 3 figures",
  "categories": [
    "cond-mat.stat-mech",
    "cond-mat.mes-hall",
    "physics.chem-ph"
  ],
  "abstract": "Using a thermodynamically consistent, mesoscopic model for modern complementary metal-oxide-semiconductor transistors, we study an array of logical circuits and explore how their function is constrained by recent thermodynamic uncertainty relations when operating near thermal energies. For a single NOT gate, we find operating direction-dependent dynamics, and an optimal trade-off between dissipated heat and operation time certainty. For a memory storage device, we find an exponential relationship between the memory retention time and energy required to sustain that memory state. For a clock, we find that the certainty in the cycle time is maximized at biasing voltages near thermal energy, as is the trade-off between this certainty and the heat dissipated per cycle. We demonstrate that a simple control mechanism for the clock leads to a monotonic increase in cycle time certainty with biasing voltage alleviating its degradation at large biasing voltages. These results provide a framework for assessing thermodynamic costs of realistic computing devices, allowing for circuits to be designed and controlled for thermodynamically optimal operation.",
  "revisions": [
    {
      "version": "v1",
      "updated": "2022-11-01T18:01:40.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "stochastic thermodynamic bounds",
      "logical circuit operation",
      "biasing voltage",
      "thermal energy",
      "simple control mechanism"
    ],
    "note": {
      "typesetting": "TeX",
      "pages": 6,
      "language": "en",
      "license": "arXiv",
      "status": "editable"
    }
  }
}