{
  "id": "1703.09747",
  "version": "v1",
  "published": "2017-03-28T18:58:10.000Z",
  "updated": "2017-03-28T18:58:10.000Z",
  "title": "Randomized Benchmarking, Correlated Noise, and Ising Models",
  "authors": [
    "Bryan H. Fong",
    "Seth T. Merkel"
  ],
  "comment": "10 pages, 7 figures",
  "categories": [
    "quant-ph"
  ],
  "abstract": "We compute the expected randomized benchmarking sequence fidelity for a system subject to Gaussian time-correlated noise. For single qubit benchmarking we show that the expected sequence fidelity is given by the partition function of a long-range coupled spin-one Ising model, with each site in the Ising model corresponding to a free evolution interval. For d-state systems, the expected sequence fidelity is given by an Ising-like model partition function whose site variables are given by the weights of the adjoint representation of SU(d). A high effective temperature expansion for the partition function in the single qubit case shows decay of sequence fidelity varying from exponential for uncorrelated noise to a power law for quasistatic noise. Fitting an exponential to the sequence fidelity decay under correlated noise gives unreliable estimates of the average gate error rate.",
  "revisions": [
    {
      "version": "v1",
      "updated": "2017-03-28T18:58:10.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "correlated noise",
      "randomized benchmarking sequence fidelity",
      "expected sequence fidelity",
      "single qubit",
      "average gate error rate"
    ],
    "note": {
      "typesetting": "TeX",
      "pages": 10,
      "language": "en",
      "license": "arXiv",
      "status": "editable"
    }
  }
}