{
  "id": "1502.07519",
  "version": "v1",
  "published": "2015-02-26T12:07:29.000Z",
  "updated": "2015-02-26T12:07:29.000Z",
  "title": "Electric-field induced switching from fcc to hcp stacking of a single layer of Fe/Ni(111)",
  "authors": [
    "Lukas Gerhard",
    "Moritz Peter",
    "Wulf Wulfhekel"
  ],
  "comment": "5 figures",
  "categories": [
    "cond-mat.mes-hall"
  ],
  "abstract": "We present a detailed study of an electric-field induced phase transition of a single layer of Fe on a Ni(111) substrate. Scanning tunneling microscopy at 4 K substrate temperature is used to provide the necessary electric field and to follow the transition from face-centered cubic to hexagonal closepacked stacking with atomic resolution.",
  "revisions": [
    {
      "version": "v1",
      "updated": "2015-02-26T12:07:29.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "single layer",
      "electric-field induced switching",
      "hcp stacking",
      "electric-field induced phase transition",
      "necessary electric field"
    ],
    "note": {
      "typesetting": "TeX",
      "pages": 0,
      "language": "en",
      "license": "arXiv",
      "status": "editable"
    }
  }
}