{
  "id": "1304.3472",
  "version": "v1",
  "published": "2013-04-11T20:10:24.000Z",
  "updated": "2013-04-11T20:10:24.000Z",
  "title": "Effect of charged line defects on conductivity in graphene: numerical Kubo and analytical Boltzmann approaches",
  "authors": [
    "T. M. Radchenko",
    "A. A. Shylau",
    "I. V. Zozoulenko",
    "A. Ferreira"
  ],
  "comment": "15 pages, 9 figures",
  "journal": "Phys. Rev. B 87, 195448 (2013)",
  "doi": "10.1103/PhysRevB.87.195448",
  "categories": [
    "cond-mat.mes-hall"
  ],
  "abstract": "Charge carrier transport in single-layer graphene with one-dimensional charged defects is studied theoretically. Extended charged defects, considered an important factor for mobility degradation in chemically-vapor-deposited graphene, are described by a self-consistent Thomas-Fermi potential. A numerical study of electronic transport is performed by means of a time-dependent real-space Kubo approach in honeycomb lattices containing millions of carbon atoms, capturing the linear response of realistic size systems in the highly disordered regime. Our numerical calculations are complemented with a kinetic transport theory describing charge transport in the weak scattering limit. The semiclassical transport lifetimes are obtained by computing scattered amplitudes within the second Born approximation. The transport electron-hole asymmetry found in the semiclassical approach is consistent with the Kubo calculations. In the strong scattering regime, the conductivity is found to be a sublinear function of electronic density and weakly dependent on the Thomas-Fermi screening wavelength. We attribute this atypical behavior to the extended nature of one-dimensional charged defects. Our results are consistent with recent experimental reports.",
  "revisions": [
    {
      "version": "v1",
      "updated": "2013-04-11T20:10:24.000Z"
    }
  ],
  "analyses": {
    "subjects": [
      "81.05.ue",
      "72.80.Vp",
      "72.10.Fk"
    ],
    "keywords": [
      "analytical boltzmann approaches",
      "charged line defects",
      "numerical kubo",
      "conductivity",
      "one-dimensional charged defects"
    ],
    "tags": [
      "journal article"
    ],
    "publication": {
      "publisher": "APS",
      "journal": "Physical Review B",
      "year": 2013,
      "month": "May",
      "volume": 87,
      "number": 19,
      "pages": 195448
    },
    "note": {
      "typesetting": "TeX",
      "pages": 15,
      "language": "en",
      "license": "arXiv",
      "status": "editable",
      "adsabs": "2013PhRvB..87s5448R"
    }
  }
}