{ "id": "1007.4417", "version": "v1", "published": "2010-07-26T10:33:59.000Z", "updated": "2010-07-26T10:33:59.000Z", "title": "Scanning Tunneling Microscopy and Spectroscopy study of charge inhomogeneities in bilayer Graphene", "authors": [ "Shyam K. Choudhary", "Anjan K. Gupta" ], "comment": "5 pages, 5 figures", "journal": "Solid State Communications, March 2011, Volume 151, Issue 5, Pages 396-399", "doi": "10.1016/j.ssc.2010.12.010", "categories": [ "cond-mat.mes-hall", "cond-mat.mtrl-sci" ], "abstract": "We report room temperature scanning tunneling microscopy and spectroscopy study of bilayer graphene prepared by mechanical exfoliation on SiO$_2$/Si surface and electrically contacted with gold pads using a mechanical mask. The bulk conductivity shows contribution from regions of varying electron density indicating significant charge inhomogeneity. Large scale topographic images show ripple like structures with a roughness of $\\sim$1nm while the small scale atomic resolution images show graphite-like triangular lattice. Local dI/dV-V tunnel spectra have an asymmetric V-shape with the minima location showing significant spatial variation indicating inhomogeneity in electron density of order 10$^{11}$ cm-2. The minima in spectra at a fixed location also shifts linearly with the gate voltage with a slope consistent with the field induced carrier density.", "revisions": [ { "version": "v1", "updated": "2010-07-26T10:33:59.000Z" } ], "analyses": { "keywords": [ "scanning tunneling microscopy", "spectroscopy study", "bilayer graphene", "scale atomic resolution images", "electron density indicating significant" ], "tags": [ "journal article" ], "publication": { "journal": "Solid State Communications", "year": 2011, "month": "Mar", "volume": 151, "number": 5, "pages": 396 }, "note": { "typesetting": "TeX", "pages": 5, "language": "en", "license": "arXiv", "status": "editable", "adsabs": "2011SSCom.151..396C" } } }