{ "id": "1004.5560", "version": "v1", "published": "2010-04-30T15:34:24.000Z", "updated": "2010-04-30T15:34:24.000Z", "title": "Scalability of Atomic-Thin-Body (ATB) Transistors Based on Graphene Nanoribbons", "authors": [ "Qin Zhang", "Yeqing Lu", "Huili Grace Xing", "Steven J. Koester", "Siyuranga O. Koswatta" ], "comment": "4 figures, accepted by EDL", "categories": [ "cond-mat.mes-hall" ], "abstract": "A general solution for the electrostatic potential in an atomic-thin-body (ATB) field-effect transistor geometry is presented. The effective electrostatic scaling length, {\\lambda}eff, is extracted from the analytical model, which cannot be approximated by the lowest order eigenmode as traditionally done in SOI-MOSFETs. An empirical equation for the scaling length that depends on the geometry parameters is proposed. It is shown that even for a thick SiO2 back oxide {\\lambda}eff can be improved efficiently by thinner top oxide thickness, and to some extent, with high-k dielectrics. The model is then applied to self-consistent simulation of graphene nanoribbon (GNR) Schottky-barrier field-effect transistors (SB-FETs) at the ballistic limit. In the case of GNR SB-FETs, for large {\\lambda}eff, the scaling is limited by the conventional electrostatic short channel effects (SCEs). On the other hand, for small {\\lambda}eff, the scaling is limited by direct source-to-drain tunneling. A subthreshold swing below 100mV/dec is still possible with a sub-10nm gate length in GNR SB-FETs.", "revisions": [ { "version": "v1", "updated": "2010-04-30T15:34:24.000Z" } ], "analyses": { "keywords": [ "graphene nanoribbon", "atomic-thin-body", "conventional electrostatic short channel effects", "scalability", "gnr sb-fets" ], "tags": [ "journal article" ], "publication": { "doi": "10.1109/LED.2010.2045100", "journal": "IEEE Electron Device Letters", "year": 2010, "month": "Jun", "volume": 31, "number": 6, "pages": 531 }, "note": { "typesetting": "TeX", "pages": 0, "language": "en", "license": "arXiv", "status": "editable", "adsabs": "2010IEDL...31..531Z" } } }