{
  "id": "0802.4073",
  "version": "v1",
  "published": "2008-02-27T19:11:48.000Z",
  "updated": "2008-02-27T19:11:48.000Z",
  "title": "Measurement of Coulomb drag between Anderson insulators",
  "authors": [
    "K. Elsayad",
    "J. P. Carini",
    "D. V. Baxter"
  ],
  "comment": "4 pages, 4 figures",
  "categories": [
    "cond-mat.mes-hall",
    "cond-mat.dis-nn"
  ],
  "abstract": "We report observations of the Coulomb drag effect between two effectively 2-d insulating a-Si_{1-x}Nb_{x} films. We find that there only exist a limited range of experimental parameters over which we can measure a sizable linear-response transresistivity (\\rho_{d}). The temperature dependence of \\rho_{d} is consistent with the layers being Efros-Shklovskii Anderson insulators provided that a 3-d density of states and a localization length smaller than that obtained from the DC layer-conductivity are assumed.",
  "revisions": [
    {
      "version": "v1",
      "updated": "2008-02-27T19:11:48.000Z"
    }
  ],
  "analyses": {
    "keywords": [
      "measurement",
      "coulomb drag effect",
      "efros-shklovskii anderson insulators",
      "localization length smaller",
      "report observations"
    ],
    "note": {
      "typesetting": "TeX",
      "pages": 4,
      "language": "en",
      "license": "arXiv",
      "status": "editable",
      "adsabs": "2008arXiv0802.4073E"
    }
  }
}